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An Automatic Trace Analysis Tool Generator for Estelle Specifications.

S. Alan EzustGregor von Bochmann
Published in: SIGCOMM (1995)
Keyphrases
  • analysis tool
  • image processing
  • semi automatic
  • fully automatic
  • real time
  • databases
  • real world
  • case study
  • multiresolution
  • data driven
  • design process
  • functional requirements
  • pseudorandom