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Static multipole method applied to boundary conditions for semiconductor device simulations.
Guillermo Indalecio Fernández
Antonio J. García-Loureiro
Manuel Aldegunde
Published in:
HPCS (2012)
Keyphrases
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boundary conditions
preprocessing
high accuracy
significant improvement
probabilistic model
detection method
objective function
cost function
similarity measure
high quality
pairwise
optical flow
clustering method
high order
sensitivity analysis
finite element method