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Code Defect Detection Model with Multi-layer Bi-directional Long Short Term Memory based on Self-Attention Mechanism.
Cong Hou
Yue Sun
Lin Li
Wei Chen
Xiaotian Xu
Published in:
EITCE (2023)
Keyphrases
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multi layer
short term
bi directional
long term
short term and long term
forecasting model
long term memory
computational model
support vector
higher level
defect detection
stock market
autoregressive
associative memory
neural network
training data
face recognition