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A Silicon Testing Strategy for Pulse-Width Failures.
Srinivas Vooka
Khushboo Agarwal
Abhijeet Shrivastava
Pranav Murthy
Ramakrishnan Venkatraman
Published in:
VLSI Design (2012)
Keyphrases
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pulse width
low cost
neural network
high speed
multiscale
search strategy
selection strategy
data mining
information retrieval
gallium arsenide