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LEMINGS: LSI's EMI-Noise Analysis with Gate Level Simulator.

Kenji ShimazakiHiroyuki TsujikawaSeijiro KojimaShouzou Hirano
Published in: ISQED (2000)
Keyphrases
  • data analysis
  • statistical analysis
  • database
  • data sets
  • neural network
  • data mining
  • machine learning
  • multiscale
  • higher level
  • high density
  • noise free
  • random noise