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Predicting Atomic Force Microscopy Topography from Optical Microscopes Using Deep Learning.
Jaewoo Jeong
Taeyeong Kim
Bong Jae Lee
Jungchul Lee
Published in:
Adv. Intell. Syst. (2023)
Keyphrases
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deep learning
atomic force microscopy
unsupervised learning
laser scanning
unsupervised feature learning
machine learning
mental models
weakly supervised
restricted boltzmann machine
deep architectures
co occurrence
higher order