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Radiation Hardened Flip-Flops Minimizing Area, Power, and Delay Overheads with 1/100 Lower α-SER in a 130 nm Bulk Process.
Ryuichi Nakajima
Kazuya Ioki
Jun Furuta
Kazutoshi Kobayashi
Published in:
IOLTS (2022)
Keyphrases
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case study
low cost
input output