Yield optimization with correlated design parameters and non-symmetrical marginal distributions.
Kumaraswamy PonnambalamAbbas SeifiJirí VlachPublished in: ISCAS (4) (2003)
Keyphrases
- design parameters
- marginal distributions
- joint distribution
- probability distribution
- design space
- random variables
- linear combination
- wavelet coefficients
- gaussian distribution
- machine learning
- random fields
- supervised learning
- graphical models
- maximum entropy
- control algorithm
- small number
- case study
- decision trees
- clustering algorithm