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An experimental approach to characterize rate-dependent failure envelopes and failure site transitions in surface mount assemblies.

Joe VargheseAbhijit Dasgupta
Published in: Microelectron. Reliab. (2007)
Keyphrases
  • failure rate
  • website
  • root cause
  • highly reliable
  • failure prediction
  • real time
  • data sets
  • neural network
  • real world
  • information retrieval
  • image processing
  • case study
  • vector field
  • surface reconstruction