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The effect of external stress on the electrical characteristics of AlGaN/GaN HEMTs.
Kun Liu
Hui Zhu
Shiwei Feng
Lei Shi
Yamin Zhang
Chunsheng Guo
Published in:
Microelectron. Reliab. (2015)
Keyphrases
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physical characteristics
databases
control system
data mining
computer vision
high speed
internal and external
transmission line
power grid