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The effect of external stress on the electrical characteristics of AlGaN/GaN HEMTs.

Kun LiuHui ZhuShiwei FengLei ShiYamin ZhangChunsheng Guo
Published in: Microelectron. Reliab. (2015)
Keyphrases
  • physical characteristics
  • databases
  • control system
  • data mining
  • computer vision
  • high speed
  • internal and external
  • transmission line
  • power grid