Login / Signup

Interconnect Modeling for Copper/Low-k Technologies.

N. S. NagarajTom BonifieldAbha SinghRoger GriesmerPoras T. Balsara
Published in: VLSI Design (2004)
Keyphrases
  • data mining
  • high speed
  • neural network
  • real world
  • machine learning
  • digital libraries
  • st century
  • high levels
  • modeling method
  • future development