A Novel Algorithm for Fault Diagnosis of Analog Circuit with Tolerances Using Improved Binary-tree SVMs Based on SOMNN Clustering.
Anna WangJunfang LiuHua LiFeng LuanWenjing YuanPublished in: ICNC (1) (2007)
Keyphrases
- fault diagnosis
- binary tree
- k means
- analog circuits
- clustering method
- multiclass svm
- expert systems
- wavelet packet transform
- machine learning
- bp algorithm
- tree structure
- support vector
- neural network
- wavelet transform
- support vector machine svm
- multi class
- control system
- object recognition
- hierarchical structure
- quadtree
- bp neural network
- clustering algorithm
- feature selection
- artificial intelligence