Login / Signup
Single event burnout in power diodes: Mechanisms and models.
A. M. Albadri
Ronald D. Schrimpf
Kenneth F. Galloway
D. Greg Walker
Published in:
Microelectron. Reliab. (2006)
Keyphrases
</>
model selection
information retrieval
probabilistic model
neural network
machine learning
three dimensional
artificial neural networks
control system
machine learning algorithms
statistical models
power consumption
mathematical models
autoregressive