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Design and Test Challenges in Resistive Switching RAM (ReRAM): An Electrical Model for Defect Injections.
Olivier Ginez
Jean-Michel Portal
Christophe Muller
Published in:
ETS (2009)
Keyphrases
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probabilistic model
mathematical model
genetic algorithm
prediction model
metamodel
neural network
computational model
statistical model
data sets
high level
learning environment
artificial neural networks
cost function
probability distribution
experimental data
formal model