Login / Signup
The reliability of semiconductor RAM memories with on-chip error-correction coding.
Rodney M. Goodman
Masahiro Sayano
Published in:
IEEE Trans. Inf. Theory (1991)
Keyphrases
</>
error correction
error detection
error control
error correcting
error detection and correction
turbo codes
block codes
ldpc codes
random access memory
data hiding
channel coding
high speed
coding scheme
reed solomon
low density parity check
memory access
watermarking scheme
bit errors
coding method
power consumption