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A Generalized Approach to Determine the Switching Reliability of GaN HEMTs on-Wafer Level.
Nicola Modolo
Andrea Minetto
Carlo De Santi
Luca Sayadi
Sebastien Sicre
Gerhard Prechtl
Gaudenzio Meneghesso
Enrico Zanoni
Matteo Meneghini
Published in:
IRPS (2021)
Keyphrases
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computer vision
reliability analysis
neural network
three dimensional
semiconductor manufacturing
confidence levels
real world
machine learning
search engine
information systems
color images
integrated circuit
levels of abstraction