Tunneling microscopy from 300 to 4.2 K.

S. A. Elrod A. Bryant A. L. deLozanne S. Park D. Smith C. F. Quate

Published in: IBM J. Res. Dev. (1986)

Keyphrases

image analysis
high throughput
microscopy images
image stacks
electron microscopy
fluorescence microscopy
image processing
clustering algorithm
three dimensional
high resolution
dynamic programming