Reflections on the engineering and operation of a large-scale embedded device vulnerability scanner.
Ang CuiSalvatore J. StolfoPublished in: BADGERS@EuroSys (2011)
Keyphrases
- embedded systems
- computer science
- small scale
- neural network
- software engineering
- real world
- portable devices
- real life
- engineering design
- scanning devices
- databases
- electrical engineering
- engineering students
- engineering problems
- structured light
- low cost
- database systems
- artificial intelligence
- genetic algorithm
- machine learning