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Low Temperature Characterization and Modeling of Hot Carrier Injection in 14 nm Si FinFET.

Junru QuDong LiuBing ChenYing SunXinze LiChengji JinJiajia ChenHaoji QianRongzong ShenXiao YuDawei GaoRan ChengGenquan Han
Published in: IRPS (2024)
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