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Low Temperature Characterization and Modeling of Hot Carrier Injection in 14 nm Si FinFET.
Junru Qu
Dong Liu
Bing Chen
Ying Sun
Xinze Li
Chengji Jin
Jiajia Chen
Haoji Qian
Rongzong Shen
Xiao Yu
Dawei Gao
Ran Cheng
Genquan Han
Published in:
IRPS (2024)
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