TLP Characterization of large gate width devices.

P. Coppens G. Jenicot H. Casier F. De Pestel F. Depuydt N. Martens Peter Moens

Published in: Microelectron. Reliab. (2007)

Keyphrases

mobile devices
information systems
nano scale
multiple input
clustering algorithm
data structure
processing capabilities
wireless sensor networks
electronic devices
embedded devices
personal computer
embedded systems
mobile robot
data sets
expert systems
database systems
learning algorithm
neural network