A Hierarchical Reliability Simulation Methodology for AMS Integrated Circuits and Systems.
Hao CaiHervé PetitJean-François NavinerPublished in: J. Low Power Electron. (2012)
Keyphrases
- integrated circuit
- mathematical models
- computing systems
- neural network
- discrete event simulation
- case study
- management system
- trading systems
- mathematical model
- user oriented evaluation
- database
- reliability analysis
- printed circuit boards
- design methodology
- hierarchical structure
- building blocks
- intelligent systems
- image analysis
- clustering algorithm
- artificial intelligence