A Contour Based Approach for Bilateral Mammogram Registration Using Discrete Wavelet Analysis.
Ramón Reig BolañoVicenç Parisi BaradadPere Martí-PuigPublished in: DCAI (2008)
Keyphrases
- wavelet analysis
- wavelet transform
- image registration
- multiresolution
- gaussian function
- mexican hat
- factor analysis
- feature detection
- low frequency
- active contours
- basis functions
- autoregressive model
- breast cancer
- image segmentation
- image compression
- high frequency
- subband
- wavelet coefficients
- computer vision
- linear combination
- search space
- object recognition
- multiscale
- image processing