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Development of Frequency-Mixed Point-Focusing Shear Horizontal Guided-Wave EMAT for Defect Inspection Using Deep Neural Network.
Hongyu Sun
Lisha Peng
Shen Wang
Songling Huang
Kaifeng Qu
Published in:
IEEE Trans. Instrum. Meas. (2021)
Keyphrases
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neural network
defect detection
decision support
pattern recognition
design process
development process
fuzzy artmap
learning environment
fuzzy logic
software engineering
information processing
neural network model
associative memory
multi layer
st century