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On RTL Testability and Gate-Level Stuck-At-Fault Coverage Correlation for Scan Circuits.
Michal Rumplík
Josef Strnadel
Published in:
DSD (2011)
Keyphrases
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higher level
levels of abstraction
neural network
information retrieval
search algorithm
database
real time
data sets
databases
artificial intelligence
image processing
image sequences
expert systems
model based diagnosis