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Minimizing the Application Time for Manufacturer Testing of FPGA (Abstract).

Franco FummiA. MarshallLaura PozziMariagiovanna Sami
Published in: FPGA (1998)
Keyphrases
  • low cost
  • machine learning
  • database
  • high level
  • artificial intelligence
  • evolutionary algorithm
  • high speed
  • hardware implementation
  • application specific
  • production planning