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Split ADC background self-calibration of a 16-b successive approximation ADC in 180nm CMOS.
John A. McNeill
Christopher L. David
Michael C. W. Coln
Ka Yan Chan
Cody Brenneman
Published in:
I2MTC (2013)
Keyphrases
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successive approximation
analog to digital converter
low cost
vector quantization
high speed
source coding
image compression
image coding
low power
cmos technology
metal oxide semiconductor