Acceleration of RAM-Tests with Associative Pattern Recognition Methods.
Djamshid TavangarianChristian ElmPublished in: Fault-Tolerant Computing Systems (1991)
Keyphrases
- pattern recognition
- significant improvement
- computational cost
- statistical tests
- statistical methods
- machine learning algorithms
- database
- image processing
- high dimensional
- hidden markov models
- rough sets
- medical images
- empirical studies
- feature selection
- cross validation
- machine learning methods
- search engine
- search methods
- machine learning