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Removing Imaging Artifacts in Electron Microscopy using an Asymmetrically Cyclic Adversarial Network without Paired Training Data.

Tran Minh QuanDavid Grant Colburn HildebrandKanggeun LeeLogan A. ThomasAaron T. KuanWei-Chung Allen LeeWon-Ki Jeong
Published in: ICCV Workshops (2019)
Keyphrases
  • electron microscopy
  • training data
  • imaging artifacts
  • low energy
  • image stacks
  • x ray
  • wireless sensor networks
  • thin film
  • training set