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Applying the Roofline Performance Model to the Intel Xeon Phi Knights Landing Processor.

Douglas DoerflerJack DeslippeSamuel WilliamsLeonid OlikerBrandon CookThorsten KurthMathieu LobetTareq M. MalasJean-Luc VayHenri Vincenti
Published in: ISC Workshops (2016)
Keyphrases
  • high level
  • statistical model
  • probability distribution
  • cost effective
  • probabilistic model
  • management system
  • computational model
  • formal model
  • data processing
  • experimental data
  • metamodel