Rapid Electromagnetic Induction Imaging With an Optically Raster-Scanned Atomic Magnetometer.
Benjamin MaddoxCameron DeansHan YaoYuval CohenFerruccio RenzoniPublished in: IEEE Trans. Instrum. Meas. (2023)
Keyphrases
- image processing
- image analysis
- high resolution
- medical imaging
- computer vision
- imaging systems
- inductive logic programming
- binary images
- document images
- inductive learning
- high frequency
- synthetic aperture
- atomic force microscopy
- data mining
- imaging technology
- program synthesis
- imaging devices
- high dynamic range
- rule induction
- light field
- digital imaging
- explanation based learning
- concept learning
- simulation software
- three dimensional
- learning algorithm
- optical imaging
- real time