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Automatic measurement system for the DC and low-f noise characterization of FETs at wafer level.
Gino Giusi
Orazio Giordano
Graziella Scandurra
Carmine Ciofi
Matteo Rapisarda
Sabrina Calvi
Published in:
I2MTC (2015)
Keyphrases
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high noise
noisy data
levels of abstraction
high levels
gaussian noise
massively parallel
random noise
real time
data mining
information retrieval
information systems
image sequences
multiscale
higher level
image noise