Measurements of near-infrared frequency mixing by metal-semiconductor point-contact diodes.
Elio BavaNiccolò BeveriniGiorgio CarelliAndrea De MicheleGianluca GalzeranoEnrico MaccioniAugusto MorettiMarco PrevedelliFiodor SorrentinoCesare SveltoPublished in: IEEE Trans. Instrum. Meas. (2005)