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Accounting for Location Measurement Error in Imaging Data With Application to Atomic Resolution Images of Crystalline Materials.
Matthew J. Miller
Matthew J. Cabral
Elizabeth C. Dickey
James M. LeBeau
Brian J. Reich
Published in:
Technometrics (2022)
Keyphrases
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image data
spatial and temporal resolution
measurement error
three dimensional
image analysis
image retrieval
high resolution
image features
input image
high quality
data points