James M. LeBeau

Publication Activity (10 Years)

Years Active: 2022-2022
Publications (10 Years): 2

Top Topics

Measurement Error

High Throughput

Top Venues

Publications

Matthew J. Miller, Matthew J. Cabral, Elizabeth C. Dickey, James M. LeBeau, Brian J. Reich
Accounting for Location Measurement Error in Imaging Data With Application to Atomic Resolution Images of Crystalline Materials. Technometrics 64 (1) (2022)
Michael Xu, Abinash Kumar, James M. LeBeau
Towards Augmented Microscopy with Reinforcement Learning-Enhanced Workflows. CoRR (2022)