Output probability density functions of logic circuits: Modeling and fault-tolerance evaluation.
Milos StanisavljevicAlexandre SchmidYusuf LeblebiciPublished in: VLSI-SoC (2010)
Keyphrases
- fault tolerance
- probability density function
- fault tolerant
- logic circuits
- load balancing
- response time
- distributed systems
- density function
- mobile agents
- low power
- peer to peer
- tunnel diode
- failure recovery
- bayesian framework
- statistical methods
- single point of failure
- machine learning
- gaussian mixture model
- mixture model
- generative model
- high dimensional