Thermally-activated degradation of InGaN-based laser diodes: Effect on threshold current and forward voltage.
Carlo De SantiMatteo MeneghiniMichael MarioliMatteo BuffoloNicola TrivellinT. WeigK. HolcK. KöhlerJ. WagnerU. T. SchwarzGaudenzio MeneghessoEnrico ZanoniPublished in: Microelectron. Reliab. (2014)