Login / Signup

Reliability testing of flexible printed circuit-based RF MEMS capacitive switches.

Simone LeeRamesh RamadossMichael BuckV. M. BrightK. C. GuptaY. C. Lee
Published in: Microelectron. Reliab. (2004)
Keyphrases
  • printed circuit
  • software reliability
  • data conversion
  • databases
  • relevance feedback
  • software testing
  • test cases