An Area Efficient Early Z -Test Method for 3-D Graphics Rendering Hardware.
Chang-Hyo YuDonghyun KimLee-Sup KimPublished in: IEEE Trans. Circuits Syst. I Regul. Pap. (2008)
Keyphrases
- detection method
- highly efficient
- experimental evaluation
- test data
- high accuracy
- computationally efficient
- image processing
- similarity measure
- objective function
- highly accurate
- data sets
- support vector machine
- high efficiency
- high precision
- clustering method
- low cost
- probabilistic model
- computational cost
- significant improvement
- feature selection
- neural network