Comparison of Log-linear Models and Weighted Dissimilarity Measures.

Daniel Keysers Roberto Paredes Enrique Vidal Hermann Ney

Published in: IbPRIA (2003)

Keyphrases

dissimilarity measure
log linear models
log linear
dissimilarity representation
similarity measure
distance measure
mixture model
computer vision
efficient learning
image processing
pattern recognition
semi supervised
clustering method