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Assessment of random and systematic errors in millimeter-wave dielectric measurement using open resonator and Fourier transform spectroscopy systems.

Mohammed N. AfsarAnusha MoonshiramYong Wang
Published in: IEEE Trans. Instrum. Meas. (2004)
Keyphrases
  • fourier transform
  • systematic errors
  • frequency domain
  • signal processing
  • millimeter wave
  • multiscale
  • pattern recognition
  • markov random field
  • infrared
  • d objects
  • semi supervised
  • face detection