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Assessment of random and systematic errors in millimeter-wave dielectric measurement using open resonator and Fourier transform spectroscopy systems.
Mohammed N. Afsar
Anusha Moonshiram
Yong Wang
Published in:
IEEE Trans. Instrum. Meas. (2004)
Keyphrases
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fourier transform
systematic errors
frequency domain
signal processing
millimeter wave
multiscale
pattern recognition
markov random field
infrared
d objects
semi supervised
face detection