EPIC: Efficient prediction of IC manufacturing hotspots with a unified meta-classification formulation.
Duo DingBei YuJoydeep GhoshDavid Z. PanPublished in: ASP-DAC (2012)
Keyphrases
- pattern classification
- support vector machine
- text classification
- prediction accuracy
- classification systems
- pattern recognition
- automatic classification
- class labels
- machine learning
- neural networks and support vector machines
- classification method
- classification algorithm
- benchmark datasets
- classification accuracy
- decision trees
- support vector machine svm
- image classification
- prediction model
- support vector
- nearest neighbour algorithm
- neural network
- microarray
- feature vectors
- feature space
- radial basis function network
- least squares support vector machine
- target variable