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PVT Tolerant Zero Bit-Error-Rate Physical Unclonable Function Exploiting Hot Carrier Injection Aging in 7nm FinFET Technology.

Jyothi Bhaskarr VelamalaSiang-jhih Sean WuPadma PenmatsaKuan-Yueh James ShenDavid JohnstonRachael Parker
Published in: CICC (2022)
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