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A Bayesian approach to characterizing uncertainty in inverse problems using coarse and fine-scale information.

Dave HigdonHerbert K. H. LeeZhuoxin Bi
Published in: IEEE Trans. Signal Process. (2002)
Keyphrases
  • fine scale
  • inverse problems
  • multiresolution
  • coarse to fine
  • computer vision
  • high quality
  • pairwise
  • higher order
  • optimization problems