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An Efficient Non-Gaussian Sampling Method for High Sigma SRAM Yield Analysis.

Jinyuan ZhaiChanghao YanSheng-Guo WangDian ZhouHai ZhouXuan Zeng
Published in: ACM Trans. Design Autom. Electr. Syst. (2018)
Keyphrases
  • wide range
  • hidden markov models
  • image processing
  • low cost
  • information retrieval
  • artificial neural networks
  • signal processing
  • statistical analysis
  • non stationary