Accurate Electrostatic Force Measurements by Atomic Force Microscopy Using Proper Distance Control.
Ryota FukuzawaDaichi KobayashiTakuji TakahashiPublished in: IEEE Trans. Instrum. Meas. (2023)
Keyphrases
- atomic force microscopy
- robotic manipulator
- control system
- control method
- highly accurate
- euclidean distance
- similarity measure
- control theory
- distance function
- high quality
- computationally efficient
- adaptive control
- distance measure
- electric field
- geometrical properties
- computer vision
- sagittal plane
- shape memory alloy