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A Targeted Sampling Strategy for Compressive Cryo Focused Ion Beam Scanning Electron Microscopy.

Daniel NichollsJack WellsAlex W. RobinsonAmirafshar MoshtaghpourMaryna KobylynskaRoland A. FleckAngus I. KirklandNigel D. Browning
Published in: ICASSP (2023)
Keyphrases
  • electron microscopy
  • sampling strategy
  • low energy
  • x ray
  • sampling strategies
  • image stacks
  • sampling methods
  • thin film
  • three dimensional
  • learning algorithm
  • feature selection