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Knowledge Transfer Framework for PVT Robustness in Analog Integrated Circuits.

Jintao LiYanhan ZengHaochang ZhiJingci YangWeiwei ShanYongfu LiYun Li
Published in: IEEE Trans. Circuits Syst. I Regul. Pap. (2024)
Keyphrases
  • knowledge transfer
  • integrated circuit
  • cross domain
  • probabilistic model
  • feature selection
  • transfer learning
  • mutual adaptation