Embedded Model Control: Application to Interferometric Metrology Lines.

Enrico S. Canuto Fabio Musso

Published in: ETFA (2006)

Keyphrases

probabilistic model
theoretical analysis
statistical model
high level
probability distribution
experimental data
neural network
access control
modeling method
process control
camera calibration
hough transform
computational model
input data
prior knowledge
artificial neural networks
decision trees