High-Bandwidth Memory (HBM) Test Challenges and Solutions.

Hongshin Jun Sang Kyun Nam Han Ho Jin Jong-Chern Lee Yong Jae Park Jaejin Lee

Published in: IEEE Des. Test (2017)

Keyphrases

high bandwidth
end to end
low latency
high density
application specific
parallel processing
mobile terminals
fiber optic
data streams
low cost
cost effective
parallel architectures