Effect of substrate bias on frequency dependence of MOSFET noise intensity.
Kenji OhmoriRanga HettiarachchiKeisaku YamadaPublished in: ESSDERC (2012)
Keyphrases
- low frequency
- noisy data
- noise reduction
- noise level
- high frequency
- signal to noise ratio
- noise model
- noisy environments
- dielectric constant
- intensity difference
- pixel intensities
- intensity inhomogeneity
- random noise
- image noise
- adverse effect
- low signal to noise ratio
- intensity variations
- intensity distribution
- multiresolution
- additive noise
- missing data